Name
Title | ||
|---|---|---|
An analysis of ternary simulation as a tool for race detection in digital MOS circuits |
Abstract | ||
|---|---|---|
Recently, Bryant developed a new switch level model for the functional simulation of race-free digital MOS circuits. The model establishes a formal correspondence to classical circuit theory. Thus the correctness of any simulation algorithm w.r.t. this model is a strong justification for using the algorithm. In [4,12] correct and efficient algorithms have been reported for simulating circuits that do not have internal race conditions. In [1] Bryant suggests to use ‘ternary’ simulation for detecting race conditions in MOS circuits. He justifies his simulation method with a couple of example circuits; however, he does not extend the simulation model to cover circuits that have internal races. |
Year | DOI | Venue |
|---|---|---|
1986 | 10.1016/0167-9260(86)90012-X | Integration |
Keywords | Field | DocType |
Hazard,MOS circuits,race,ternary,simulation | Digital electronics,Computer science,Correctness,Algorithm,Electronic engineering,Ternary operation,Network analysis,Electronic circuit,Conjecture,Integrated circuit,Functional simulation | Journal |
Volume | Issue | ISSN |
4 | 4 | 0167-9260 |
Citations | PageRank | References |
3 | 0.92 | 2 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| T. Lengauer | 1 | 110 | 15.00 |
| S. Näher | 2 | 83 | 10.41 |