Name
Abstract | ||
|---|---|---|
As predicted by technology roadmaps, embedded micro-electro-mechanical-systems (MEMS) is yet another step in the continuous search for higher levels of integration and miniaturization. MEMS are analog components and the test paradigm is similar to the case of analog and mixed-signal circuits. However, given the fact that they work with signals other than electrical, the test of these embedded parts poses new challenges. In this paper, we will review some recent works in this field and we will present a complete approach to MEMS built-in-self-test (BIST) based on pseudorandom testing. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1016/j.mejo.2006.04.016 | Microelectronics Journal |
Keywords | Field | DocType |
higher level,mixed-signal circuit,fault simulation,fault modelling,mems built-in-self-test,embedded part,new challenge,defects,analog component,complete approach,bist,failure mechanisms,mems,continuous search,built-in-self-test technique,test paradigm,embedded micro-electro-mechanical-systems | Signal,Microelectromechanical systems,Electronic engineering,Analog signal,Miniaturization,Engineering,Electronic circuit,Electrical engineering,Pseudorandom number generator,Built-in self-test,Fault modelling | Journal |
Volume | Issue | ISSN |
37 | 12 | Microelectronics Journal |
Citations | PageRank | References |
2 | 0.47 | 18 |
Authors | ||
3 | ||