Paper Info
Title
A Hierarchical, Desgin-for-Testability (DFT) Methodology for the Rapid Prototyping of Application-Specific Signal Processors (RASSP)
Abstract
Abstract This paper describes a design for testability process, which is highly automated, hierarchical, and spans the entire life cycle. The process was developed for the DoD's RASSP Program and contributes significantly to the RASSP goals of 4x improvement,in cycle time, design quality, and life cycle costs. Keywords - BIST, design for testability, rapid prototyping, RASSP, signal processors 1.0 Introduction The Rapid Prototyping of Application Specific Signal Processors (RASSP) program is a DoD sponsored program to develop processes for the design, manufacturing, and fielding of signal processor based systems (the processes being referred to in this paper collectively as a "methodology") that will achieve four times (4x) improvements in cycle time, design quality, and life cycle costs. As part of that methodology, a design for testability (DFT) process or methodology has been developed that supports and facilitates the achievement of the RASSP goals and strives for testable systems at each phase of the life cycle and at each level of the packaging hierarchy. This paper describes the key features of the RASSP DFT Methodology. The DFT methodology,provides designers and test engineers a process for introducing test
Year
DOI
Venue
1995
10.1109/TEST.1995.529856
ITC
Keywords
Field
DocType
application-specific signal processors,rapid prototyping,computer architecture,dft,system testing,design for testability,life cycle,integrated circuit design,prototypes,development process,signal processing,application specific integrated circuits,cycle time,design methodology
Rapid prototyping,Testability,Design for testing,Application specific,Computer science,Software prototyping,Application-specific integrated circuit,Electronic engineering,Integrated circuit design,Built-in self-test
Conference
ISBN
Citations 
PageRank 
0-7803-2992-9
1
0.39
References 
Authors
1
2
Name
Order
Citations
PageRank
Richard M. Sedmak111.74
John Evans222.43