Name
Abstract | ||
|---|---|---|
Testing of FPGAs is gaining more and more interest because of the application of FPGA devices in many safety-critical systems. We propose GABES, a tool for the generation of test patterns for application-dependent testing of SEUs in SRAM-FPGAs, based on a genetic algorithm. Test patterns are generated and selected by the algorithm according to their fault coverage: Faults are injected in a simulated model of the circuit, the model is executed for each test pattern and the respective fault coverage is computed. We focus on SEUs in configuration bits affecting logic resources of the FPGA. This makes our fault model much more accurate than the classical stuck-at model. Results from the application of the tool to some circuits from the ITC'99 benchmarks are reported. These results suggest that this approach may be effective in the inspection of safety-critical components of control systems implemented on FPGAs. |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1016/j.sysarc.2013.10.006 | Journal of Systems Architecture - Embedded Systems Design |
Keywords | Field | DocType |
seu testing,respective fault coverage,safety-critical system,genetic algorithm,simulated model,classical stuck-at model,safety-critical component,fault model,fpga device,test pattern,fault coverage | Fault coverage,Computer science,Parallel computing,Field-programmable gate array,Real-time computing,Static random-access memory,Control system,Electronic circuit,Genetic algorithm,Fault model,Embedded system | Journal |
Volume | Issue | ISSN |
59 | 10 | 1383-7621 |
Citations | PageRank | References |
7 | 0.50 | 33 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Cinzia Bernardeschi | 1 | 226 | 31.87 |
| Luca Cassano | 2 | 62 | 11.36 |
| Mario G. C. A. Cimino | 3 | 268 | 29.52 |
| Andrea Domenici | 4 | 100 | 17.16 |