Name
Title | ||
|---|---|---|
Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope |
Abstract | ||
|---|---|---|
In this paper, we present the temperature profile measurements of a PN thermoelectric couple. The study is made in the AC regime. A couple is fed by a sinusoidal current and, using a scanning thermal microscope (SThM) and a lock-in scheme, we measure the amplitude and the phase of the first harmonic of the temperature along the surface of the couple. The influence of frequency is observed and we present a model which predicts the thermal behavior of the couple. The results of this model are in excellent agreement with the measurements. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1016/j.mejo.2004.06.010 | Microelectronics Journal |
Keywords | Field | DocType |
Thermoelectric device,Atomic force microscopy,Thermal properties identification | Thermal,Scanning electron microscope,Harmonic,p–n junction,Microscope,Engineering,Amplitude,Alternating current,Thermoelectric effect,Condensed matter physics | Journal |
Volume | Issue | ISSN |
35 | 10 | 0026-2692 |
Citations | PageRank | References |
4 | 1.38 | 0 |
Authors | ||
7 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Luis-David Patino Lopez | 1 | 10 | 4.31 |
| Stéphane Grauby | 2 | 21 | 9.89 |
| Stefan Dilhaire | 3 | 47 | 12.64 |
| M. Amine Salhi | 4 | 4 | 1.38 |
| Wilfrid Claeys | 5 | 45 | 10.30 |
| Stéphane Lefèvre | 6 | 4 | 1.38 |
| Sebastian Volz | 7 | 60 | 4.31 |