Abstract | ||
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Component tolerances and mismatches due to process variations severely degrade the performance of bandgap reference (BGR) circuits. In this paper, we describe the design of a BGR considering the Pelgrom's mismatch model. The main purpose of our methodology is to convey the design to reach a good trade-off between area and mismatch. Implemented in standard 0.35µm CMOS technology, our circuit also includes a straightforward 4-bits trimming circuit to achieve more process variations independence. Its Monte Carlo temperature coefficient average is 40-ppm/ºC and the reference output voltage average is 1.230V. The area of the BGR is 400x350µm2 |
Year | DOI | Venue |
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2007 | 10.1109/ISCAS.2007.378348 | ISCAS |
Keywords | Field | DocType |
microelectronics,monte carlo methods,cmos integrated circuits,temperature,4 bit,degradation,monte carlo,voltage,circuits,semiconductor device modeling,cmos technology,photonic band gap,process variation | 4-bit,Monte Carlo method,Computer science,Voltage,Temperature coefficient,CMOS,Electronic engineering,Electronic circuit,Trimming,Electrical engineering,Bandgap voltage reference | Conference |
ISSN | ISBN | Citations |
0271-4302 | 1-4244-0921-7 | 8 |
PageRank | References | Authors |
0.86 | 4 | 3 |
Name | Order | Citations | PageRank |
---|---|---|---|
Juan Pablo Martinez Brito | 1 | 26 | 5.13 |
sergio bampi | 2 | 496 | 102.12 |
hamilton klimach | 3 | 71 | 20.07 |