Name
Abstract | ||
|---|---|---|
Embedded software requires high quality to meet customer requirements and to achieve product competitiveness. Testability maturity model (TMM)and test process improvement (TPI) are recommended to improve test activities, which are important for product quality. However, TMM and TPI in themselves are not appropriate for embedded software since they are lack of consideration on embedded software. This paper deals with the properties of embedded software and industrial challenges based on existing model and we suggest embedded test process improvement model (Emb-TPI). Emb-TPI considers practical improvement strategies for the quality of embedded software and focuses on evaluation procedures that achieve cost-effectiveness and valid evaluation results. We present the results of applying Emb-TPI to product development division (PDD) to prove that the model is valid. Emb-TPI provides methods to evaluate test activities in embedded software development and helps to reveal insufficient areas of test activities, which ultimately improves test capabilities. |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1109/QSIC.2009.64 | QSIC |
Keywords | Field | DocType |
product competitiveness,test capability,software quality,program testing,embedded test process improvement model,test activity,embedded software developments,high quality,embedded software development,product development division,product development,software developments,embedded software,embedded systems,test process improvement,test process improvement model,product quality,maturity model,cost effectiveness,hardware,automation,capability maturity model | Avionics software,Embedded software,Personal software process,Systems engineering,Computer science,Package development process,Software quality control,Software quality,Software verification and validation,Reliability engineering,Software development | Conference |
ISSN | ISBN | Citations |
1550-6002 | 978-1-4244-5912-4 | 6 |
PageRank | References | Authors |
0.47 | 4 | 1 |