Paper Info
Title
ICTSSE: An object-oriented IC test software supporting environment
Abstract
An IC test software supporting environment—ICTSSE, which supports the migration and simulation of test pattern programs on heterogeneous ATEs, is presented. ICTSSE is a subsystem of Test Development System (TeDS). It has the capabilities of verifying the IC’s stimulus/response vectors and associated timing resources against the target ATE. The general data interchange format, which is the center of the TEDS, is built for test pattern migration.
Year
DOI
Venue
1995
10.1007/BF02948340
J. Comput. Sci. Technol.
Keywords
DocType
Volume
object-oriented paradigm,cat,data interchanging format.,object oriented
Journal
10
Issue
ISSN
Citations 
5
1860-4749
0
PageRank 
References 
Authors
0.34
6
3
Name
Order
Citations
PageRank
Yuning Sun100.68
Xiaoming Wang200.34
Wanchun Shi301.35