Abstract | ||
---|---|---|
Starting from the analysis of the most widely adopted methodologies and the most successful industrial tools in the fields of HLS and DFT, this paper proposes a general framework for a pragmatic, systematic and flexible SFT methodology. The prerequisites for such a methodology, together with the state of the art are first assessed, then an overview of the approach is presented, followed by step-by-step details through a case-study of High-Level Synthesis For BIST. Examples of first obtained results are also provided. |
Year | DOI | Venue |
---|---|---|
1996 | 10.1109/ATS.1996.555169 | Asian Test Symposium |
Keywords | Field | DocType |
high-level synthesis,testability methodology,flexible sft methodology,successful industrial tool,general framework,flexible synthesis,step-by-step detail,network synthesis,design for testability,high level synthesis,system testing,constraint optimization,design optimization | Design for testing,Testability,Data path,Computer science,System testing,High-level synthesis,Automatic testing,Real-time computing,Electronic engineering,Constrained optimization,Built-in self-test | Conference |
ISSN | ISBN | Citations |
1085-7735 | 0-8186-7478-4 | 0 |
PageRank | References | Authors |
0.34 | 2 | 3 |
Name | Order | Citations | PageRank |
---|---|---|---|
V. C. Alves | 1 | 3 | 1.29 |
A. R. Antunes | 2 | 0 | 0.34 |
Marzouki, M. | 3 | 0 | 0.34 |