Name
Year | DOI | Venue |
|---|---|---|
1995 | 10.1145/224818.224901 | ASP-DAC |
Keywords | DocType | ISBN |
built-in self test scheme,probability,shift registers,vlsi,fault detection,device under test,linear feedback shift register | Conference | 0-89791-766-9 |
Citations | PageRank | References |
4 | 0.42 | 4 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| T. Raju Damarla | 1 | 36 | 2.93 |
| Wei Su | 2 | 262 | 26.41 |
| Gerald T. Michael | 3 | 4 | 0.42 |
| Moon J. Chung | 4 | 4 | 0.42 |
| Charles E. Stroud | 5 | 470 | 41.17 |