Paper Info
Title
Reliability Assurance of RAID Storage Systems for a Wide Range of Latent Sector Errors
Abstract
The low-cost disk drives, which are increasingly being adopted in today's data storage systems, have higher capacity but lower reliability, which leads to more frequent rebuilds and to a higher risk of unrecoverable or latent media errors. An intra-disk redundancy scheme has been proposed to cope with such errors and enhance the reliability of RAID systems. Empirical field results recently reported in the literature, however, suggest that the extent to which unrecoverable media errors occur is higher than the data sheet specifications provided by the disk manufacturers. Our results demonstrate that the reliability improvement due to intradisk redundancy is adversely affected because of the increase in the number of unrecoverable errors. We demonstrate that, by revising the parameter choice of the intradisk redundancy scheme, we can obtain essentially the same reliability as that of a system operating without unrecoverable sector errors. The I/O and throughput performance are evaluated by means of analysis and event-driven simulations. The effects of the spatial locality of errors and of the error-burst length distribution on the system reliability are also investigated.
Year
DOI
Venue
2008
10.1109/NAS.2008.20
NAS
Keywords
Field
DocType
stochastic modeling,latent sector errors,mttdl,integrity protection method,wide range,discrete event simulation,low-cost disk drives,raid,reliability analysis,spatial error locality,unrecoverable errors,data storage systems,cryptographic file system,raid storage systems,reliability assurance,intra-disk redundancy scheme,reliability,unrecoverable or latent sector errors,storage system,end-to-end security,event-driven simulations,error-burst length distribution,stochastic model,redundancy,error correction,manufacturing,data storage,error probability,media,throughput,encoding
Locality,Computer science,Computer data storage,Real-time computing,Error detection and correction,Redundancy (engineering),RAID,Throughput,Encoding (memory),Discrete event simulation
Conference
ISBN
Citations 
PageRank 
978-0-7695-3187-8
3
0.41
References 
Authors
6
2
Name
Order
Citations
PageRank
I. Iliadis126926.31
Xiao Yu Hu2119760.14