Name
Abstract | ||
|---|---|---|
This paper presents an insight into the performance degradation in Gilbert mixer due to the voltage stress-induced hot carrier effects. Analytical analysis relates the performance degradation with the model parameter shifts caused by voltage stress. The stress-induced parameter shifts are examined experimentally. Performance degradation in mixer is investigated through Spectre-RF simulation with the models extracted from measured data. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1587/elex.2.133 | IEICE ELECTRONICS EXPRESS |
Keywords | Field | DocType |
CMOS integrated circuits, hot carrier, stress, noise, gain, linearity | Computer science,Linearity,Voltage,Degradation (geology),Electronic engineering,CMOS,Model parameter,Gilbert mixer | Journal |
Volume | Issue | ISSN |
2 | 5 | 1349-2543 |
Citations | PageRank | References |
1 | 0.42 | 2 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Chuanzhao Yu | 1 | 33 | 7.05 |
| Hong Yang | 2 | 1 | 0.76 |
| Enjun Xiao | 3 | 1 | 1.09 |
| J. S. Yuan | 4 | 31 | 7.21 |