Title
Low Kickback Noise Techniques For Cmos Latched Comparators
Abstract
The latched comparator is utilized in virtually all analog-to-digital converter architectures. It uses a positive feedback mechanism to regenerate the analog input signal into a full-scale digital level. Such high voltage variations in the regeneration nodes are coupled to the input, disturbing the input voltage - kickback noise. This paper reviews existing solutions to minimize the kickback noise and proposes two new ones. HSPICE simulations verify the effectiveness of our techniques.
Year
DOI
Venue
2004
10.1109/ISCAS.2004.1328250
2004 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL 1, PROCEEDINGS
Keywords
Field
DocType
degradation,positive feedback,voltage,impedance,positive feedback mechanism,high voltage,cmos integrated circuits,parasitic capacitance,cmos technology,feedback
Parasitic capacitance,Comparator,Computer science,Spice,Voltage,CMOS,Analog-to-digital converter,Electronic engineering,Analog signal,High voltage,Electrical engineering
Conference
Citations 
PageRank 
References 
7
0.81
3
Authors
2
Name
Order
Citations
PageRank
Pedro M. Figueiredo14012.16
J. C. Vital2416.55