Name
Abstract | ||
|---|---|---|
In this paper, we propose a unified approach to test generation, test stimulus compression, and test response compaction. By integrating virtual models of the decompressor and the compactor with the CUT, a standard ATPG tool can be used to generate compressed tests and their corresponding compacted responses as a unified process. In comparison with the existing solutions which treat them as separate tasks, this unified approach could potentially achieve a higher fault coverage and obtain higher input compression and output compaction ratios. Such a unified approach also offers better flexibility for evaluating various test volume reduction architectures. Our experimental results demonstrate the effectiveness of the proposed method. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/TEST.2006.297644 | 2006 IEEE INTERNATIONAL TEST CONFERENCE, VOLS 1 AND 2 |
Keywords | Field | DocType |
fault coverage,data reduction,automatic test pattern generation,unified process | Stuck-at fault,Automatic test pattern generation,Fault coverage,Computer science,Unified Process,Electronic engineering,Test data,Test compression,Compaction,Data reduction | Conference |
ISSN | Citations | PageRank |
1089-3539 | 4 | 0.44 |
References | Authors | |
21 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yung-Chieh Lin | 1 | 167 | 10.50 |
| Kwang-Ting Cheng | 2 | 5755 | 513.90 |