Name
Title | ||
|---|---|---|
A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)] |
Year | DOI | Venue |
|---|---|---|
2009 | 10.1109/MDT.2009.2 | IEEE Design & Test of Computers |
Keywords | Field | DocType |
sun,system on a chip,fpga,system on chip,random access,design for testability,network on a chip,dft,system testing,mems,soc,testing,sections,sip | Design for testing,System on a chip,Logic testing,Computer science,System testing,Network on a chip,Automatic testing,Electronic engineering,Vlsi test | Journal |
Volume | Issue | Citations |
26 | 1 | 0 |
PageRank | References | Authors |
0.34 | 0 | 1 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Scott Davidson | 1 | 56 | 22.93 |