Title
RDIS: Tolerating Many Stuck-At Faults in Resistive Memory
Abstract
With their potential for high scalability and density, resistive memories are foreseen as a promising technology that overcomes the physical limitations confronted by charge-based DRAM and flash memory. Yet, a main burden towards the successful adoption and commercialization of resistive memories is their low cell reliability caused by process variation and limited write endurance. Typically, faulty and worn-out cells are permanently stuck at either `0' or `1'. To overcome the challenge, a robust error correction scheme that can recover from many hard faults is required. In this paper, we propose and evaluate RDIS, a novel scheme to efficiently tolerate memory stuck-at faults. RDIS allows for the correct retrieval of data by recursively determining and efficiently keeping track of the positions of the bits that are stuck at a value different from the ones that are written, and then, at read time, by inverting the values read from those positions. RDIS is characterized by a very low probability of failure that increases slowly with the relative increase in the number of faults. Moreover, RDIS tolerates many more faults than the best existing scheme-by up to 95 percent on average at the same overhead level.
Year
DOI
Venue
2015
10.1109/TC.2013.2295825
Computers, IEEE Transactions  
Keywords
Field
DocType
fault tolerance,integrated circuit reliability,resistive ram,faulty cells,overhead level,read time,resistive memories,robust error correction scheme,stuck-at fault tolerance,worn-out cells,hard faults,phase change memory,reliability,error correction,radiation detectors,noise measurement,computer architecture
Dram,Phase-change memory,Flash memory,Computer science,Parallel computing,Real-time computing,Error detection and correction,Fault tolerance,Process variation,Scalability,Resistive random-access memory
Journal
Volume
Issue
ISSN
64
3
0018-9340
Citations 
PageRank 
References 
5
0.48
14
Authors
3
Name
Order
Citations
PageRank
Rakan Maddah1674.92
Rami Melhem22537164.09
Sangyeun Cho3129473.92