Abstract | ||
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This study aims to understand the effects of spatial resolution on the surface backscattering characteristics of polarimetric radar. Surface scattering models based on approximate methods are formulated by the roughness second-order statistics to obtain a closed-form expression for the radar scattering response. Most studies have been carried out based on the roughness parameters of the infinite surface. In this letter, we propose the roughness autocorrelation function of truncated surfaces for a more realistic description of the roughness parameters of high-resolution radar. The use of roughness parameters for a truncated surface in the scattering model is pertinent to explain the dependence of the backscattering coefficient on the spatial resolution. Simulation results indicate that the traditional computation of the surface backscattering based on the autocovariance function of an infinite surface leads to an underestimation of the backscattering signature of the high-resolution radar. |
Year | DOI | Venue |
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2015 | 10.1109/LGRS.2014.2361144 | Geoscience and Remote Sensing Letters, IEEE |
Keywords | Field | DocType |
geophysical equipment,radar polarimetry,statistics,surface roughness,surface scattering,approximate method,closed-form expression,high-resolution imaging radar microwave surface scattering,high-resolution imaging radar surface roughness,high-resolution radar backscattering signature underestimation,infinite surface autocovariance function,infinite surface roughness parameter,polarimetric radar,radar scattering response,roughness second-order statistics,spatial resolution backscattering coefficient dependence,spatial resolution effect,surface backscattering characteristic,surface backscattering traditional computation,surface scattering model,truncated surface roughness autocorrelation function,imaging radar,spatial resolution,closed form expression,scattering,rough surfaces,backscatter,radar imaging | Autocovariance,Radar,Radar imaging,Polarimetry,Backscatter,Remote sensing,Optics,Surface finish,Scattering,Mathematics,Surface roughness | Journal |
Volume | Issue | ISSN |
12 | 4 | 1545-598X |
Citations | PageRank | References |
1 | 0.35 | 9 |
Authors | ||
4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Sang-Eun Park | 1 | 201 | 24.33 |
Laurent Ferro-Famil | 2 | 289 | 45.54 |
Sophie Allain | 3 | 16 | 4.47 |
Eric Pottier | 4 | 190 | 24.49 |