Name
Abstract | ||
|---|---|---|
•The degradation-data-driven method is used to analyze the lifetime of HPWLEDs.•We present a bi-exponential model to improve the fit accuracy for the data.•The two-stage method provides the highest ability to explain variation.•A response model was used to predict the useful lifetime. |
Year | DOI | Venue |
|---|---|---|
2014 | 10.1016/j.microrel.2014.02.029 | Microelectronics Reliability |
Keywords | Field | DocType |
Accelerated degradation test,HPWLED,Useful lifetime,Bi-exponential model,Degradation-data-driven method. | Least squares,Inverse,Applied mathematics,Exponential function,Nonlinear system,Diode,Electronic engineering,Extrapolation,Flux,Engineering,Light-emitting diode,Statistics | Journal |
Volume | Issue | ISSN |
54 | 6 | 0026-2714 |
Citations | PageRank | References |
9 | 0.70 | 9 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Fu-Kwun Wang | 1 | 94 | 22.41 |
| Yi-Chen Lu | 2 | 11 | 1.12 |