Abstract | ||
---|---|---|
•Transient excitation at photocurrent from an unlatched to latched state is studied.•The analytical expressions of pulse width and PRF effects in lath-up are obtained.•The model in this paper can be widely used in different latch-up situations. |
Year | DOI | Venue |
---|---|---|
2014 | 10.1016/j.microrel.2014.08.014 | Microelectronics Reliability |
Keywords | Field | DocType |
CMOS transmission gate,Laser,Latch-up,Transient analysis | Photocurrent,CMOS,Laser,Electronic engineering,Pulse (signal processing),Transmission gate,Engineering,Transient analysis,Silicon-controlled rectifier | Journal |
Volume | Issue | ISSN |
54 | 12 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 7 |
Authors | ||
5 |
Name | Order | Citations | PageRank |
---|---|---|---|
Weicheng Qiu | 1 | 0 | 1.01 |
Xiang-Ai Cheng | 2 | 0 | 0.34 |
Rui Wang | 3 | 0 | 0.34 |
Zhongjie Xu | 4 | 0 | 0.34 |
Chao Shen | 5 | 0 | 0.34 |