Paper Info
Title
Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience.
Abstract
•Our RAP model enables systematic CMOS fault abstraction and error propagation.•RAP assumes that physically induced faults eventually manifest as bit flips.•Higher layer error models can be derived from probabilistic bit flip functions.•SoC designers can optimize system resilience across multiple abstraction levels.•Real-world case studies with SRAM soft-errors in CPU cache and MIMO detector are shown.
Year
DOI
Venue
2014
10.1016/j.microrel.2013.12.012
Microelectronics Reliability
Field
DocType
Volume
Dependability,Propagation of uncertainty,System on a chip,Finite-state machine,Software,Engineering,Probabilistic logic,Abstraction layer,Application software,Reliability engineering
Journal
54
Issue
ISSN
Citations 
6
0026-2714
10
PageRank 
References 
Authors
0.62
23
20
Name
Order
Citations
PageRank
Andreas Herkersdorf170388.32
Hananeh Aliee2515.89
Michael Engel3100.62
Michael Glaß451045.33
Christina Gimmler-Dumont5574.92
J. Henkel64471366.50
Veit Kleeberger7573.83
Michael A. Kochte827627.23
Johannes Maximilian Kühn9182.95
Daniel Mueller-Gritschneder1012314.40
Sani R. Nassif112268247.45
Holm Rauchfuss12566.16
Wolfgang Rosenstiel131462212.32
Ulf Schlichtmann1464570.67
Muhammad Shafique151945157.67
Mehdi Baradaran Tahoori16100.62
Jürgen Teich172886273.54
Norbert Wehn181165137.17
Christian Weis1928426.11
Hans-Joachim Wunderlich201822155.30