Name
Title | ||
|---|---|---|
Study of bending reliability and electrical properties of platinum lines on flexible polyimide substrates. |
Abstract | ||
|---|---|---|
•We reported in the bending reliability of Ti/Pt lines, sputtered on polyimide foil.•The change in electrical resistance was registered during circular bending tests.•The studied reliability issues included TCR, drift and bending at different radii.•We determined working limits of conductive lines for flexible electronics. |
Year | DOI | Venue |
|---|---|---|
2014 | 10.1016/j.microrel.2014.06.015 | Microelectronics Reliability |
Keywords | Field | DocType |
Flexible electronics,Polymeric substrate,Bending reliability,Temperature coefficient of resistance | Electrical resistance and conductance,Curvature,Electrical conductor,Sputter deposition,Temperature coefficient,Photolithography,Electronic engineering,Flexible electronics,Bending,Engineering | Journal |
Volume | Issue | ISSN |
54 | 11 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 1 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Francisco Molina-Lopez | 1 | 0 | 0.34 |
| R. E. de Araújo | 2 | 0 | 0.34 |
| M. Jarrier | 3 | 0 | 0.34 |
| Jérôme Courbat | 4 | 0 | 0.34 |
| Danick Briand | 5 | 0 | 0.68 |
| N. F. de Rooij | 6 | 1 | 1.50 |