Name
Abstract | ||
|---|---|---|
•We explore robustness of dual-rail and single-ended multiplexer structures.•We compare different multiplexer architectures using a suitable design metric.•Robustness gain using DCVS multiplexers in a LUT is evaluated.•We studied the effect of aging phenomena on the proposed DCVS multiplexer. |
Year | DOI | Venue |
|---|---|---|
2015 | 10.1016/j.microrel.2015.01.011 | Microelectronics Reliability |
Keywords | Field | DocType |
Permanent faults,Defect modeling,Defect tolerance,FPGA look-up table,Aging-aware analysis | Netlist,Architecture,Field-programmable gate array,Electronic engineering,CMOS,Multiplexer,Robustness (computer science),Engineering,Interconnection | Journal |
Volume | Issue | ISSN |
55 | 3 | 0026-2714 |
Citations | PageRank | References |
0 | 0.34 | 17 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Arwa Ben Dhia | 1 | 32 | 5.50 |
| Mariem Slimani | 2 | 23 | 7.05 |
| Hao Cai | 3 | 60 | 21.94 |
| Lirida A. B. Naviner | 4 | 83 | 26.52 |