Name
Title | ||
|---|---|---|
Impact of bias conditions on performance degradation in SiGe HBTs irradiated by 10 MeV Br ion. |
Year | Venue | DocType |
|---|---|---|
2014 | Microelectronics Reliability | Journal |
Volume | Issue | Citations |
54 | 12 | 0 |
PageRank | References | Authors |
0.34 | 3 | 9 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yabin Sun | 1 | 0 | 0.34 |
| Jun Fu | 2 | 0 | 4.39 |
| Jun Xu | 3 | 83 | 12.24 |
| Yudong Wang | 4 | 0 | 0.68 |
| Wei Zhou | 5 | 112 | 27.01 |
| Wei Zhang | 6 | 0 | 0.68 |
| Jie Cui | 7 | 5 | 3.57 |
| Gaoqing Li | 8 | 0 | 0.34 |
| Zhihong Liu | 9 | 0 | 1.01 |