Title
A bitstream readback-based automatic functional test and diagnosis method for Xilinx FPGAs.
Abstract
In this paper, a novel bitstream readback-based test and diagnosis method including a bitstream parsing algorithm as well as a corresponding bitstream readback-based fault and diagnosis algorithm for Xilinx FPGAs is presented. The proposed method can be applied to both configurable logic block (CLB) and interconnect resource (IR) test. Further, the algorithm is suitable for all Virtex and Spartan series FPGAs. The issues such as fault coverage, diagnostic resolution, I/O numbers, as well as configuration numbers not addressed well by some previous works can be solved or partly relieved. The proposed method is evaluated by testing several Xilinx series FPGAs, and experimental results are provided. (C) 2014 Elsevier Ltd. All rights reserved.
Year
DOI
Venue
2014
10.1016/j.microrel.2014.03.017
Microelectronics Reliability
Keywords
Field
DocType
FPGA,Readback,Bitstream,Test,Diagnosis
Spartan,Fault coverage,Computer science,Field-programmable gate array,Virtex,Logic block,Parsing,Interconnection,Bitstream,Embedded system
Journal
Volume
Issue
ISSN
54
8
0026-2714
Citations 
PageRank 
References 
4
0.46
11
Authors
7
Name
Order
Citations
PageRank
Aiwu Ruan191.32
Bairui Jie240.46
Li Wan340.46
Junhao Yang440.46
Chuanyin Xiang540.46
Zujian Zhu680.97
Yu Wang781.31