Name
Abstract | ||
|---|---|---|
•We analyse several techniques to harden radiation effects and noise immunity.•We implement these techniques using 7nm FinFET technology.•A new design methodology is presented, called Strengthening.•This design style is technology’s independent.•Strengthening presents the best immunity in a noise environment. |
Year | DOI | Venue |
|---|---|---|
2014 | 10.1016/j.microrel.2013.12.018 | Microelectronics Reliability |
DocType | Volume | Issue |
Journal | 54 | 4 |
ISSN | Citations | PageRank |
0026-2714 | 1 | 0.38 |
References | Authors | |
12 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Antonio Calomarde | 1 | 8 | 4.42 |
| E. Amat | 2 | 30 | 10.36 |
| Francesc Moll | 3 | 55 | 14.87 |
| Julio Vigara | 4 | 1 | 0.38 |
| Antonio Rubio | 5 | 18 | 5.41 |