Title
Mutation-Based Generation of Software Product Line Test Configurations.
Abstract
Software Product Lines (SPLs) are families of software products that can be configured and managed through a combination of features. Such products are usually represented with a Feature Model (FM). Testing the entire SPL may not be conceivable due to economical or time constraints and, more simply, because of the large number of potential products. Thus, defining methods for generating test configurations is required, and is now a very active research topic for the testing community. In this context, mutation has recently being advertised as a promising technique. Mutation evaluates the ability of the test suite to detect defective versions of the FM, called mutants. In particular, it has been shown that existing test configurations achieving the mutation criterion correlate with fault detection. Despite the potential benefit of mutation, there is no approach which aims at generating test configurations for SPL with respect to the mutation criterion. In this direction, we introduce a search-based approach which explores the SPL product space to generate product test configurations with the aim of detecting mutants.
Year
DOI
Venue
2014
10.1007/978-3-319-09940-8_7
Lecture Notes in Computer Science
Keywords
Field
DocType
Software Product Lines,Test Configuration Generation,Search-Based Software Engineering,Mutation,Feature Models
Test suite,Computer science,Fault detection and isolation,Software,Feature model,Artificial intelligence,Software product line,Product topology,Computer engineering,Machine learning,Search-based software engineering
Conference
Volume
ISSN
Citations 
8636
0302-9743
22
PageRank 
References 
Authors
0.53
29
3
Name
Order
Citations
PageRank
Christopher Henard138310.88
Mike Papadakis2111452.77
Yves Le Traon33922190.39