Title
Inadmissible Class of Boolean Functions under Stuck-at Faults
Abstract
Several underlying structural and functional factors that determine the fault behavior of a network are not yet well understood. In this paper, we show that there exists a large class of Boolean functions, called root functions, which can never appear as faulty response in an irredundant two-level circuit even when any arbitrary multiple stuck-at faults are injected. Conversely, we show that any other Boolean function can appear as a faulty response in an irredundant realization of some root function under certain stuck-at faults. We characterize this new class of functions and show that for n variables, their number is exactly equal to the number of independent dominating sets (Harary and Livingston, Appl. Math. Lett., 1993) in a Boolean n-cube. Similar properties are observed for multiple-valued logic functions as well. Finally, we discuss its application to logic design and point out some open problems.
Year
DOI
Venue
2014
10.1109/ISMVL.2014.49
Multiple-Valued Logic
Keywords
Field
DocType
Boolean functions,fault diagnosis,logic design,logic testing,multivalued logic circuits,AND-OR circuits,Boolean functions,Boolean n-cube,arbitrary stuck-at faults,dominating set,fault behavior,faulty response,functional factor,logic design,multiple-valued logic functions,root functions,structural factor,two-level circuit,Boolean functions,Multiple-valued functions,hypercube,redundancy,stuck-at faults,testing
Boolean network,Boolean function,Discrete mathematics,Boolean circuit,Computer science,Parity function,Product term,And-inverter graph,Boolean expression,Circuit minimization for Boolean functions
Conference
Volume
ISSN
Citations 
abs/1309.3993
0195-623X
2
PageRank 
References 
Authors
0.40
16
4
Name
Order
Citations
PageRank
Debesh K. Das113224.41
Debabani Chowdhury220.40
Bhargab B. Bhattacharya3848118.02
Tsutomu Sasao41083141.62