Title
Embedded measurement system for non-destructive testing using new eddy currents planar array probe
Abstract
This paper describes the development, implementation and characterization of an embedded measurement system for non-destructive testing using a new eddy currents planar probe array. The probe has multiple, independent excitation driver traces as well as multiple sensing coils placed between the excitation traces in a matrix like configuration. The measurement system is based on a FPGA that controls which excitation traces are used and which sensitive coils are measured either in a differential or absolute configuration. FEM simulations validate the probe configuration and measurement results demonstrate the system operation.
Year
DOI
Venue
2014
10.1109/I2MTC.2014.6860811
Instrumentation and Measurement Technology Conference
Keywords
Field
DocType
coils,eddy current testing,finite element analysis,intelligent sensors,probes,fem,fpga,absolute configuration,differential configuration,eddy currents,embedded measurement system,excitation traces,independent excitation driver traces,matrix like configuration,multiple sensing coils,nondestructive testing,planar array probe,differential planar array probe,fem simulations,non-destructive testing,pulsed eddy currents testing,harmonic analysis,non destructive testing,materials
Planar array,System of measurement,Field-programmable gate array,Nondestructive testing,Electronic engineering,Finite element method,Excitation,Planar,Eddy current,Mathematics
Conference
Citations 
PageRank 
References 
0
0.34
1
Authors
4
Name
Order
Citations
PageRank
Abrantes, R.100.34
Luis S. Rosado2152.77
Pedro M. Ramos311517.91
Moisés Piedade4588.92