Paper Info
Title
Exploiting dynamic partial reconfiguration for on-line on-demand testing of permanent faults in reconfigurable systems
Abstract
Reconfigurable systems are increasingly employed in many application fields, including aerospace. The long term exposure to radiation of space electronics can cause permanent faults, that may lead to the failure of the mission. In this paper we present a novel technique for on-line on-demand testing of permanent faults in the routing structure of SRAM-based FPGAs, that are employed in reconfigurable systems. The basic idea is to place testing circuits on the resources of the FPGA which are unused at the moment to test them before using those resources when a functional module of the reconfigurable system has to be placed. The proposed technique has been implemented and the achieved fault coverage has been assessed on a real-world reconfigurable system. This experiment demonstrated that all the faults in the routing resources under test can be detected.
Year
DOI
Venue
2014
10.1109/DFT.2014.6962065
Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Keywords
Field
DocType
SRAM chips,fault diagnosis,field programmable gate arrays,logic testing,FPGA,SRAM,dynamic partial reconfiguration,online on demand testing,permanent faults,reconfigurable systems,space electronics,testing circuits,Aerospace,Dynamic Partial Reconfiguration,On-Demand Testing,On-Line Testing,Permanent Faults,Reconfigurable Systems,SRAM-based FPGAs,Satellite
Aerospace,On demand,Fault coverage,Computer science,Field-programmable gate array,Real-time computing,Electronic engineering,Static random-access memory,Electronic circuit,Functional module,Control reconfiguration,Embedded system
Conference
ISSN
Citations 
PageRank 
1550-5774
1
0.35
References 
Authors
11
4
Name
Order
Citations
PageRank
Sorrenti, D.110.35
Cozzi, D.281.40
Korf, S.310.69
Cassano, L.450.77