Paper Info
Title
Cost-driven statistical analysis for selection of alternative measurements of analog circuits
Abstract
In this paper, we introduce a new method for improving the use of Alternative Measurements Strategy for analog circuit testing. The goal is to reduce the test cost by selecting the cheapest set of measurements that do not bring redundant information about the state of the circuit, without reducing test coverage. The proposed method consists in finding a subset of a given set of parameters which explains the dispersion of the circuit performances. The efficiency of the proposed approach is demonstrated on a critical example using continuous-time A/D conversion.
Year
DOI
Venue
2014
10.1109/ICECS.2014.7049932
Electronics, Circuits and Systems
Keywords
Field
DocType
analogue circuits,analogue-digital conversion,measurement systems,statistical analysis,alternative measurement strategy,analog circuit testing,circuit performances,continuous-time A-D conversion,cost-driven statistical analysis,Built-in Test,Data Mining,Indirect measures selection,Model classification,Modeling techniques,Monte-Carlo simulation
Code coverage,Monte Carlo method,Analogue electronics,Computer science,Circuit extraction,Electronic engineering,Statistical analysis
Conference
Citations 
PageRank 
References 
0
0.34
8
Authors
4
Name
Order
Citations
PageRank
Verdy, M.100.34
Ratiu, A.241.09
Morche, D.3235.81
De Foucauld, E.472.16