Name
Abstract | ||
|---|---|---|
The author describes a modular board tester architecture that provides high performance, at a low total cost of ownership, with the promise of future enhancements. The distributed architecture dictates the use of several unusual custom integrated circuits. The extensive use of integration allows each resource to have independent control of levels and timing at a reasonable cost. Fixture performance and accuracy specifications, the two major obstacles to higher usable test speeds with traditional systems, are significantly improved, allowing the performance of this system to be easily applied in normal testing environment |
Year | DOI | Venue |
|---|---|---|
1989 | 10.1109/TEST.1989.82365 | Washington, DC |
Keywords | Field | DocType |
application specific integrated circuits,automatic test equipment,automatic testing,distributed processing,modules,printed circuit testing,ATE,PCB testing,automatic testing,combined in-circuit/functional tester,cost,custom integrated circuits,distributed architecture,modular board tester architecture | USable,Automatic test equipment,System testing,Computer science,Total cost of ownership,Electronic engineering,Application-specific integrated circuit,Modular design,Systems architecture,Integrated circuit,Embedded system | Conference |
Citations | PageRank | References |
0 | 0.34 | 6 |
Authors | ||
1 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Jay M. Stepleton | 1 | 0 | 0.34 |