Title
A critical look at design guidelines for SOI logic gates
Abstract
Design guidelines for static and domino SOI CMOS are evaluated. Restructuring the logic to eliminate gates with large fan-ins is almost as beneficial for SOI as for bulk-Si. Published design fixes for eliminating parasitic bipolar induced upset are shown to be imperfect. PHI predischarge is thus proposed as an improved method for eliminating data upset due to both bipolar leakage and charge sharing.
Year
DOI
Venue
2002
10.1109/ISCAS.2002.1010210
Circuits and Systems, 2002. ISCAS 2002. IEEE International Symposium  
Keywords
Field
DocType
CMOS logic circuits,logic design,logic gates,silicon-on-insulator,PHI predischarge,Si,bipolar leakage,charge sharing,design guidelines,domino SOI CMOS,parasitic bipolar induced upset elimination,static SOI CMOS
Silicon on insulator,Logic synthesis,Logic gate,Leakage (electronics),Computer science,Charge sharing,Domino,Electronic engineering,CMOS,Upset,Electrical engineering
Conference
Volume
Citations 
PageRank 
3
1
0.40
References 
Authors
1
2
Name
Order
Citations
PageRank
Rouwaida Kanj126229.95
Elyse Rosenbaum26121.99