Name
Abstract | ||
|---|---|---|
A new scheme for detecting edges and lines in multi- channel SAR images is proposed. The line detector is con- structed from the edge detector. The latter is based on multi- variate statistical hypothesis tests applied to log-intensity SAR images. The raw results are vectorized by a tradi- tional bright line extraction process. The scheme is illus- trated by extracting dark linear structures on various full- polarimetric SAR images. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/ICPR.2002.1048455 | Pattern Recognition, 2002. Proceedings. 16th International Conference |
Keywords | Field | DocType |
edge detection,statistical analysis,synthetic aperture radar,dark linear structures extraction,edge detection,line detection,log-intensity SAR images,multichannel SAR images,multivariate statistical hypothesis tests,polarimetric SAR images,traditional bright line extraction process | Computer vision,Satellite,Speckle pattern,Pattern recognition,Computer science,Edge detection,Synthetic aperture radar,Artificial intelligence,Polarimetric sar,Pixel,Detector,Statistical hypothesis testing | Conference |
Volume | ISSN | Citations |
2 | 1051-4651 | 4 |
PageRank | References | Authors |
0.64 | 1 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Dirk Borghys | 1 | 43 | 6.07 |
| Vinciane Lacroix | 2 | 4 | 0.64 |
| Christiaan Perneel | 3 | 19 | 5.03 |