Name
Abstract | ||
|---|---|---|
The techniques implemented in WAVESCAN have resulted in a waveshape capture and analysis tool that is fast and easy to use, and which at the same time provides the user with a more accurate and comprehensive view of real-time signal behavior at the pins of a VLSI device under test. A lack of published specifications and benchmark data on other waveshape software makes rigorous comparison impossible; however, it is believed the techniques described in this work represent a significant advancement |
Year | DOI | Venue |
|---|---|---|
1988 | 10.1109/TEST.1988.207834 | Washington, DC |
Keywords | Field | DocType |
VLSI,automatic test equipment,automatic testing,computer aided analysis,distributed processing,integrated circuit testing,software packages,waveform analysis,ATE,VLSI,WAVESCAN,analysis,software packages,waveshape capture,waveshape software | Waveform analysis,Graphics,Device under test,Automatic test equipment,Computer science,Automatic testing,Electronic engineering,Software,Very-large-scale integration,Computer engineering | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-8186-0870-6 | 0 |
PageRank | References | Authors |
0.34 | 3 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Arthur E. Downey | 1 | 0 | 0.34 |
| Kazuhiko Matsuda | 2 | 0 | 0.34 |