Title
Extension of Swerlein's algorithm for AC voltage measurement in the frequency domain
Abstract
Two sampling algorithms that use a high-resolution voltmeter for accurately measuring the amplitudes and phase angles of the harmonics of a low-frequency, low-distortion, voltage waveform are presented. The technique is an extension to the frequency domain of a previously described approach. In the new approach, the harmonic parameters are evaluated by a least-squares, three-parameter, sine-fit algorithm. A faster algorithm that uses discrete Fourier transforms is also presented. The latter algorithm can estimate the parameters of m harmonics of a 100-Hz low distortion waveform in less than 4m seconds. The relative standard uncertainty associated with the RMS estimate depends on the waveform stability, harmonic content, and noise variance, and is 2.5×10-6 for low-distortion, 100 Hz sinusoidal waveforms in the 10-V range. This uncertainty figure includes the noise variance contribution of the waveform generator used in the tests.
Year
DOI
Venue
2003
10.1109/TIM.2003.811582
Instrumentation and Measurement, IEEE Transactions
Keywords
Field
DocType
harmonic parameters,low distortion waveform,voltmeters,noise variance,frequency domain extension,sampling algorithms,signal sampling,waveform stability,noise,voltage measurement,rms sinusoidal voltage waveform value,waveform generator,statistical analysis,harmonic amplitudes,swerlein algorithm,transfer standards,rms harmonics,frequency-domain analysis,measurement uncertainty,harmonic phase angles,noise variance contribution,sinusoidal waveforms,frequency domain ac voltage measurement,discrete fourier transforms,least squares approximations,waveform harmonic content,low-frequency low-distortion voltage waveform,harmonic analysis,10 v,least-squares three-parameter sine-fit algorithm,signal resolution,stability,rms estimate,high-resolution voltmeter,100 hz,multiple linear regression algorithm,relative standard uncertainty,sampling algorithm,discrete fourier transform,harmonic distortion,indexing terms,parameter estimation,frequency domain analysis,low frequency,frequency domain,least square,high resolution,sampling methods,uncertainty
Frequency domain,Waveform,Signal generator,Harmonic,Algorithm,Electronic engineering,Harmonic analysis,Harmonics,Amplitude,Distortion,Mathematics
Journal
Volume
Issue
ISSN
52
2
0018-9456
ISBN
Citations 
PageRank 
0-7803-7242-5
3
0.86
References 
Authors
1
1
Name
Order
Citations
PageRank
Gregory A. Kyriazis141.91