Name
Abstract | ||
|---|---|---|
A general-purpose, reconfigurable logic circuit, including an FPGA and a standard USB communications port, is introduced to implement many of the functions of traditional automated test equipment (ATE). An optional port to local memory is included for applications requiring extensive test vector storage. The test core provides a substantial number of programmable I/Os for testing other circuits. It may be used either to enhance the capabilities of ATE or to provide autonomous testing within large systems or arrays of components. Based upon limitations of current BIST and ATE, the need for the digital test core is described. The test core concept is introduced, and a specific circuit design is presented. This design is first evaluated independently and is then embedded into two example applications, including: (1) a high speed transmitter/receiver, and (2) a continuity checker for high-density flip-chips. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/TEST.2002.1041793 | ITC |
Keywords | Field | DocType |
automatic test equipment,built-in self test,field programmable gate arrays,flip-chip devices,integrated circuit testing,logic testing,ATE,FPGA,automated test equipment,circuit design,continuity checker,high speed transmitter/receiver,high-density flip-chips,multi-purpose digital test core,programmable I/Os,programmable logic,reconfigurable logic circuit,standard USB communications port,test vector storage | Test vector,Automatic test pattern generation,Logic gate,Automatic test equipment,Computer science,System testing,Field-programmable gate array,Electronic engineering,Computer hardware,Built-in self-test,Embedded system,Programmable logic device | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-7542-4 | 5 |
PageRank | References | Authors |
0.84 | 5 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Davis, J.S. | 1 | 5 | 0.84 |
| David C. Keezer | 2 | 45 | 9.64 |