Name
Abstract | ||
|---|---|---|
There are several approaches that can be applied to the multi-Gigahertz testing problem. These can be classified as either (1) internal test, as in built-in self test (BIST), or (2) external test, as applied by automated test equipment (ATE). Both these general strategies are in widespread use today. Furthermore, they are often used together to solve particularly challenging test requirements. Since the BIST and ATE approaches each have their benefits and limitations, the combination of the two provides for a variety of trade-offs. However, another degree of freedom is represented by the introduction of active circuitry near to the DUT (typically mounted on the load board). This we refer to as a "test support processor" (TSP). Generally the approach may involve the use of BIST and ATE as well as the TSP itself. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/TEST.2002.1041931 | ITC |
Keywords | Field | DocType |
automatic test equipment,built-in self test,integrated circuit testing,logic testing,very high speed integrated circuits,ATE,BIST,BIST/ATE benefits/limitations,DUT load board mounted active circuitry,TSP,automated test equipment,built-in self test,external test,internal test,logic testing,multi-GHz IC testing,test support processors,very high speed IC | Logic testing,Automatic test equipment,Computer science,Automatic testing,Field-programmable gate array,Electronic engineering,Test requirements,Self test,Embedded system,Built-in self-test | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-7542-4 | 0 |
PageRank | References | Authors |
0.34 | 5 | 1 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David C. Keezer | 1 | 45 | 9.64 |