Name
Title | ||
|---|---|---|
Using a log-normal failure rate distribution for worst case bound reliability prediction |
Abstract | ||
|---|---|---|
Prior research has suggested that the failure rates of faults follow a log normal distribution. We propose a specific model where distributions close to a log normal arise naturally from the program structure. The log normal distribution presents a problem when used in reliability growth models as it is not mathematically tractable. However we demonstrate that a worst case bound can be estimated that is less pessimistic than our earlier worst case bound theory. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1109/ISSRE.2003.1251046 | ISSRE |
Keywords | Field | DocType |
program diagnostics,software reliability,statistical distributions,log-normal failure rate distribution,program structure,reliability growth model,worst case bound reliability prediction | Program structure,Computer science,Failure rate,Probability distribution,Statistics,Log-normal distribution,Software quality,Reliability engineering | Conference |
ISSN | ISBN | Citations |
1071-9458 | 0-7695-2007-3 | 11 |
PageRank | References | Authors |
0.62 | 9 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Peter G. Bishop | 1 | 11 | 0.62 |
| Robin E. Bloomfield | 2 | 227 | 44.91 |