Name
Abstract | ||
|---|---|---|
Outlier detection as a technique for improving product quality is explained, this is followed by a discussion of the implementation issues seen when applied to a production test environment. Finally a solution to these problems is described. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1109/TEST.2003.1270914 | Test Conference, 2003. Proceedings. ITC 2003. International |
Keywords | Field | DocType |
fault detection,outlier detection,printed circuits | Anomaly detection,Fault coverage,Computer science,Fault detection and isolation,Printed circuit board,Electronic engineering,Reliability engineering,Fault indicator | Conference |
Volume | ISSN | ISBN |
1 | 1089-3539 | 0-7803-8106-8 |
Citations | PageRank | References |
3 | 0.48 | 1 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Paul Buxton | 1 | 3 | 0.48 |
| Paul Tabor | 2 | 3 | 0.48 |