Name
Abstract | ||
|---|---|---|
In support of hyperspectral sensor system design and parameter tradeoff investigations, an analytical end-to-end remote sensing system performance forecasting model has been extended to cover the visible through longwave infrared portion of the optical spectrum (0.4-14 m). The model uses statistical descrip- tions of surface spectral reflectances/emissivities and temperature variations in a scene and propagates them through the effects of the atmosphere, the sensor, and processing transformations. A resultant system performance metric is then calculated based on these propagated statistics. This paper presents theory for the analytical transformation of surface statistics to at-sensor spectral radiance statistics for a downward-looking hyperspectral sensor observing both reflected sunlight and thermally emitted radiation. Comparisons of the model predictions with measurements from an airborne hyperspectral sensor are presented. Example parameter trades are included to show the utility of the model for applications in sensor design and operation. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/TGRS.2004.841428 | Geoscience and Remote Sensing, IEEE Transactions |
Keywords | Field | DocType |
geophysical signal processing,geophysical techniques,infrared imaging,microwave measurement,remote sensing,sunlight,0.4 to 14 micron,atmosphere effects,downward-looking hyperspectral sensor,full-spectrum spectral imaging system,hyperspectral sensor system design,longwave infrared,optical spectrum,reflected sunlight,remote sensing system performance forecasting model,spectral radiance statistics,statistical description,surface spectral emissivity,surface spectral reflectance,surface statistics,system performance metric,temperature variation,thermally emitted radiation,visible,predictive models,hyperspectral sensors,spectral reflectance,hyperspectral imaging,multispectral images,system performance,spectral imaging,spectrum,system modeling,infrared,atmospheric modeling,statistical analysis,indexing terms,optical imaging | Spectral imaging,Full spectral imaging,Multispectral image,Remote sensing,Optics,Hyperspectral imaging,Multispectral pattern recognition,Longwave,Infrared,Mathematics,Radiance | Journal |
Volume | Issue | ISSN |
43 | 3 | 0196-2892 |
Citations | PageRank | References |
31 | 2.70 | 3 |
Authors | ||
2 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| John P. Kerekes | 1 | 194 | 35.38 |
| Baum, J.E. | 2 | 31 | 2.70 |