Name
Abstract | ||
|---|---|---|
Recent advances in circuit design and fabrication of superconducting integrated circuits have enabled us to demon- strate an ac Josephson voltage standard (ACJVS) that generates both ac and dc waveforms up to 242-mV peak voltage. Using a Fast Fourier Transform spectrum analyzer and an ac-dc transfer stan- dard, we characterize ACJVS operating margins by performing "flat-spot" measurements at the level of a part in for all eight bias parameters. By verifying that every bias parameter has a "flat-spot" (i.e., a range of bias values over which the measured ACJVS output is precisely constant), we demonstrate that all Josephson junctions on the chip are operating properly. Index Terms—AC measurements, AC voltage standard, Josephson arrays, Josephson devices. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/TIM.2004.843070 | Instrumentation and Measurement, IEEE Transactions |
Keywords | Field | DocType |
Josephson effect,fast Fourier transforms,measurement standards,spectral analysers,superconducting integrated circuits,voltage measurement,AC Josephson voltage standard,AC measurements,AC waveform,AC-DC transfer standard,ACJVS operating margins,DC waveforms,Josephson arrays,Josephson devices,Josephson junctions,bias parameter,circuit design,fast Fourier transform,flat-spot measurements,precision measurements,spectrum analyzer,superconducting integrated circuits,AC measurements,AC voltage standard,Josephson arrays,Josephson devices | Josephson effect,Josephson voltage standard,Waveform,Voltage,Circuit design,Electronic engineering,Chip,Fast Fourier transform,Spectrum analyzer,Electrical engineering,Physics | Journal |
Volume | Issue | ISSN |
54 | 2 | 0018-9456 |
Citations | PageRank | References |
8 | 1.79 | 2 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| C. J. Burroughs | 1 | 58 | 21.52 |
| Samuel P. Benz | 2 | 106 | 20.78 |
| Paul D. Dresselhaus | 3 | 98 | 17.82 |
| Yonuk Chong | 4 | 17 | 4.25 |