Paper Info
Title
Test generation for accurate prediction of analog specifications
Abstract
ATPG approaches for analog circuits in the past have targeted the testing of catastrophic and parametric faults. It has been shown recently that analog circuit specifications can be predicted from the transient response of the circuit under test. In this paper, we present a new ATPG algorithm for synthesizing a test stimulus that enables accurate prediction of circuit specifications from its response to the test stimulus. Use of simple linear models for ATPG and more complex nonlinear models for specification prediction results in a test generation procedure that is both accurate and simulation efficient. Due to the incorporation of measurement noise during test optimization, robust specification prediction is possible
Year
DOI
Venue
2000
10.1109/VTEST.2000.843837
Montreal, Que.
Keywords
Field
DocType
analogue integrated circuits,automatic test pattern generation,integrated circuit testing,measurement errors,transient response,ATPG approaches,analog circuits,analog specifications,circuit specifications,linear models,measurement noise,nonlinear models,robust specification prediction,specification prediction results,test optimization,test stimulus,transient response
Transient response,Automatic test pattern generation,Nonlinear system,Analogue electronics,Noise measurement,Computer science,Linear model,Electronic engineering,Real-time computing,Parametric statistics,Observational error
Conference
ISSN
ISBN
Citations 
1093-0167
0-7695-0613-5
40
PageRank 
References 
Authors
6.61
11
2
Name
Order
Citations
PageRank
Voorakaranam, R.1406.61
Abhijit Chatterjee2599.10