Name
Abstract | ||
|---|---|---|
Abstract—A measurement,method is proposed to characterize the substrate coupling between digital and analog sections of a mixed-signal CMOS chip. Induced noise and spurious signals can be measured by a custom-designed analog sensor. This paper pro- poses a method that, when given such a sensor, allows to measure the crosstalk between digital and analog chip sections. Calibrated sampling scope measurements,illustrate the performance of the measurement,setup. Index Terms—High frequency measurements, mixed signal mea- |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/19.948307 | Instrumentation and Measurement, IEEE Transactions |
Keywords | Field | DocType |
CMOS integrated circuits,network analysers,calibration,integrated circuit testing,substrate coupling,mixed-signal CMOS chip,noise,spurious signals,waveform analysis,mixed-signal substrate coupling,custom designed analog sensor,cmos integrated circuits,crosstalk,mixed analogue-digital integrated circuits,time-domain analysis,calibrated sampling scope,integrated circuit noise,substrates,mixed signal substrate coupling,mixed signal cmos chip,electric noise measurement,custom-designed analog sensor,calibrated sampling | Analog device,Noise measurement,Substrate coupling,CMOS,Electronic engineering,Analog signal,Mixed-signal integrated circuit,Spurious relationship,Calibration,Mathematics | Journal |
Volume | Issue | ISSN |
50 | 4 | 0018-9456 |
ISBN | Citations | PageRank |
0-7803-5890-2 | 4 | 5.84 |
References | Authors | |
1 | 4 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yves Rolain | 1 | 346 | 68.97 |
| Van Moer, W. | 2 | 57 | 24.84 |
| Vandersteen, G. | 3 | 72 | 17.97 |
| m van heijningen | 4 | 68 | 20.06 |