Name
Title | ||
|---|---|---|
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis |
Abstract | ||
|---|---|---|
The new non-invasive backside timing characterization technique, Picosecond Imaging Circuit Analysis (PICA), was applied to the identification and analysis of a race condition which occurred in an early design of the L1 cache of the S/390 microprocessor. The circuit switching activity was visualized in reconstructed slow motion videos of passing and failing conditions. An automated emission waveform extraction and analysis tool was used to perform a quantitative study of the failing condition. |
Year | DOI | Venue |
|---|---|---|
2000 | 10.1109/ATS.2000.893614 | Test Symposium, 2000. |
Keywords | Field | DocType |
hazards and race conditions,integrated circuit testing,integrated memory circuits,IBM G6 microprocessor,L1 cache,Picosecond Imaging Circuit Analysis,circuit switching,imaging circuit analysis,non-invasive backside timing,race condition,timing analysis,waveform extraction | Race condition,Circuit switching,CPU cache,Computer science,Waveform,Microprocessor,Real-time computing,Electronic engineering,Picosecond,Static timing analysis,Network analysis,Computer hardware | Conference |
ISSN | ISBN | Citations |
1081-7735 | 0-7695-0887-1 | 0 |
PageRank | References | Authors |
0.34 | 4 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Stas Polonsky | 1 | 6 | 3.86 |
| McManus, M. | 2 | 12 | 3.20 |
| Knebel, D. | 3 | 12 | 3.20 |
| S. E. Steen | 4 | 121 | 10.67 |