Title
A histogram-based classifier on overlapped bins
Abstract
The subclass method is a classifier based on approximation of class regions. It assumes that all classes are separable (but not necessarily linear separable). We extend the method so as to meet cases in which class-conditional probability density functions (PDFs) overlap each other. In this extension, the method becomes a histogram approach for approximating PDFs, but the method allows overlapping of bins unlike usual histogram approaches. It is shown that this method is consistent in the sense that the error rate approaches the Bayes error rate as the number of samples tends to infinity. It is also shown that the convergence rate is faster than that using a previous MDL-based histogram approach in the range of practical number of samples
Year
DOI
Venue
2000
10.1109/ICPR.2000.906012
Pattern Recognition, 2000. Proceedings. 15th International Conference
Keywords
Field
DocType
Bayes methods,approximation theory,convergence,error statistics,learning (artificial intelligence),pattern classification,probability,statistical analysis,Bayes method,approximation,error rate,histogram,overlapped bins,pattern classification,probability density function,training samples
Density estimation,Histogram,Pattern recognition,Word error rate,Approximation theory,Histogram matching,Artificial intelligence,Rate of convergence,Bayes error rate,Mathematics,Bayes classifier
Conference
Volume
ISSN
ISBN
2
1051-4651
0-7695-0750-6
Citations 
PageRank 
References 
0
0.34
3
Authors
3
Name
Order
Citations
PageRank
Mineichi Kudo1927116.09
Hideyuki Imai210325.08
Masaru Shimbo317933.02