Paper Info
Title
Two-dimensional CMOS image sensor characterization
Abstract
In this work two-dimensional (2-D) measurements obtained by the unique submicron scanning system (S-cube system) for the industrial graded CMOS image sensor (CIS) are presented. Full 2-D point spread function (PSF) extracted for several CIS sub arrays via sub-micron spot light stimulation is used for full sensor characterization; including crosstalk (CTK) generation phenomena, its dependence on the array topology and the "neighborhood" condition, along with a 2-D pixel MTF calculated from the PSF measurements. The degradation of the imager performance caused by the diffusion effects is apparent from the calculated MTF. The effectiveness and advantages of the proposed method are shown; enabling both to determine the influence of each pixel-composing element on its overall signal, along with sensor resolution abilities characterization for each wavelength of interest. The advantages and necessities of 2D-characterization for sensor performance understanding and improvement are clearly emphasized
Year
DOI
Venue
2006
10.1109/ISCAS.2006.1693401
Island of Kos
Keywords
Field
DocType
CMOS image sensors,diffusion,optical crosstalk,optical transfer function,2D CMOS image sensor,2D measurements,2D point spread function,CIS sub arrays,CTK generation,PSF,S-cube system,array topology,crosstalk generation,diffusion,multisensor,sensor performance,sub-micron spot light stimulation,submicron scanning system
Optical transfer function,Image sensor,Crosstalk,Computer science,Electronic engineering,Pixel,LIGHT STIMULATION,Point spread function,Wavelength
Conference
ISSN
ISBN
Citations 
0271-4302
0-7803-9389-9
0
PageRank 
References 
Authors
0.34
0
4
Name
Order
Citations
PageRank
Shcherback, I.100.34
Segal, R.200.34
Alexander Belenky320.89
Orly Yadid-Pecht423035.79