Name
Abstract | ||
|---|---|---|
This paper describes a test application for an IC with over 200 logic signals each carrying multiple-gigahertz data. An aggregate data rate approaching a terabit-per-second is attained during the test. A high pin-count automated test system with a maximum frequency of 1.33 Gbps DNRZ is used as a development platform. Data rate tripling logic is added to the system to produce stimuli signals each with DNRZ rates up to 4 Gbps. High-speed sampling circuits are added to capture the device output signals at these same frequencies. Several example measurements illustrate the signal quality that is achieved. The extraordinary performance exhibited by this application represents one of the most challenging digital test applications reported to-date, and foreshadows expectations for future automated test equipment |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/TEST.2001.966741 | Baltimore, MD |
Keywords | Field | DocType |
automatic test equipment,automatic testing,calibration,integrated circuit testing,logic testing,multiplexing equipment,signal sampling,1.33 Gbit/s,4 Gbit/s,IC,aggregate data rate,automated test equipment,digital test applications,high pin-count automated test system,high-speed sampling circuits,maximum frequency 1.33 Gbps,signal quality,test application | Signal quality,Computer science,Automatic test equipment,System testing,Electronic engineering,Application-specific integrated circuit,Sampling (statistics),Data rate,Terabit,Computer hardware,Calibration | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-7169-0 | 8 |
PageRank | References | Authors |
1.21 | 6 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| David C. Keezer | 1 | 45 | 9.64 |
| Zhou, Q. | 2 | 8 | 1.21 |
| Bair, C. | 3 | 8 | 1.21 |
| Kuan, J. | 4 | 8 | 1.21 |