Name
Abstract | ||
|---|---|---|
Atomic force microscopy (AFM) is a recent technique generating tridimensional images at nanometric scale whatever the nature of the chemical sample. An AFM microscope affords the measurement of interatomic forces exerting between a probe associated to a cantilever and a chemical sample. A force spectrum f(z) shows the force evolution as a function of the probe-sample distance z. A reproduction of this analysis in conjunction with the scan of the sample surface yields a force-volume image f(x, y, z). Today, the analysis of a force-volume image remains mainly descriptive. We introduce a signal processing formulation aiming at a precise characterization of each pixel (x, y) of the sample surface. The signal processing problems include the decomposition of a force spectrum into elementary patterns and the factorization of a force-volume image. We discuss the ability of decomposition methods to solve these problems and we illustrate the discussion by means of experimental data. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/ISBI.2008.4541319 | Paris |
Keywords | Field | DocType |
atomic force microscopy,chemical analysis,potential energy functions,AFM microscope,atomic force microscopy,cantilever,chemical sample,force-volume images,interatomic forces,signal processing formulation,tridimensional images,Atomic force microscopy (AFM),convolutive mixture of signals,force-volume imaging,tridimensional signals | Signal processing,Computer vision,Nanotechnology,Atomic force microscopy,Cantilever,Computer science,Optics,Microscope,Factorization,Pixel,Artificial intelligence | Conference |
ISSN | ISBN | Citations |
1945-7928 | 978-1-4244-2003-2 | 0 |
PageRank | References | Authors |
0.34 | 2 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Charles Soussen | 1 | 113 | 15.21 |
| David Brie | 2 | 130 | 24.28 |
| Fabien Gaboriaud | 3 | 0 | 0.34 |
| Cyril Kessler | 4 | 0 | 0.34 |