Abstract | ||
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Probes used for contactless electromagnetic field capture or injection are characterized. Depending on the probe structure, they interact preferentially with the electric or magnetic field. The optimal size of the probes for broad-frequency-band measurements is investigated. However, it is shown particularly for the magnetic field probe that considerations about the size and the structures presented in this paper are not sufficient for a good discrimination between electric and magnetic fields. Then, the space resolution of near-field measurements is discussed, with application to the field capture of a microstrip line under operation. |
Year | DOI | Venue |
---|---|---|
2010 | 10.1109/TIM.2009.2023148 | Instrumentation and Measurement, IEEE Transactions |
Keywords | Field | DocType |
electromagnetic fields,microstrip lines,probes,Probe characterization,broad-frequency-band measurements,electric field,electromagnetic near-field studies,magnetic fields,microstrip line,probe characterization,probe structure,Electric field,electromagnetic (EM) analysis,magnetic field,probe antennas,reflection,simulation | Magnetic field,Electric field,Magnetic analysis,Electrical conductor,Near and far field,Electronic engineering,Electromagnetic radiation,Electromagnetic field,Microstrip,Physics | Journal |
Volume | Issue | ISSN |
59 | 2 | 0018-9456 |
Citations | PageRank | References |
3 | 0.81 | 1 |
Authors | ||
4 |
Name | Order | Citations | PageRank |
---|---|---|---|
Jarrix, S. | 1 | 7 | 3.05 |
Tristan Dubois | 2 | 7 | 2.81 |
Adam, R. | 3 | 3 | 0.81 |
Nouvel, P. | 4 | 14 | 14.82 |