Title
Probe Characterization for Electromagnetic Near-Field Studies
Abstract
Probes used for contactless electromagnetic field capture or injection are characterized. Depending on the probe structure, they interact preferentially with the electric or magnetic field. The optimal size of the probes for broad-frequency-band measurements is investigated. However, it is shown particularly for the magnetic field probe that considerations about the size and the structures presented in this paper are not sufficient for a good discrimination between electric and magnetic fields. Then, the space resolution of near-field measurements is discussed, with application to the field capture of a microstrip line under operation.
Year
DOI
Venue
2010
10.1109/TIM.2009.2023148
Instrumentation and Measurement, IEEE Transactions
Keywords
Field
DocType
electromagnetic fields,microstrip lines,probes,Probe characterization,broad-frequency-band measurements,electric field,electromagnetic near-field studies,magnetic fields,microstrip line,probe characterization,probe structure,Electric field,electromagnetic (EM) analysis,magnetic field,probe antennas,reflection,simulation
Magnetic field,Electric field,Magnetic analysis,Electrical conductor,Near and far field,Electronic engineering,Electromagnetic radiation,Electromagnetic field,Microstrip,Physics
Journal
Volume
Issue
ISSN
59
2
0018-9456
Citations 
PageRank 
References 
3
0.81
1
Authors
4
Name
Order
Citations
PageRank
Jarrix, S.173.05
Tristan Dubois272.81
Adam, R.330.81
Nouvel, P.41414.82