Title
Exact stuck-at fault classification in presence of unknowns
Abstract
Fault simulation is an essential tool in electronic design automation. The accuracy of the computation of fault coverage in classic n-valued simulation algorithms is compromised by unknown (X) values. This results in a pessimistic underestimation of the coverage, and overestimation of unknown (X) values at the primary and pseudo-primary outputs. This work proposes the first stuck-at fault simulation algorithm free of any simulation pessimism in presence of unknowns. The SAT-based algorithm exactly classifies any fault and distinguishes between definite and possible detects. The pessimism w.r.t. unknowns present in classic algorithms is discussed in the experimental results on ISCAS benchmark and industrial circuits. The applicability of our algorithm to large industrial circuits is demonstrated.
Year
DOI
Venue
2012
10.1109/ETS.2012.6233017
European Test Symposium
Keywords
Field
DocType
benchmark testing,electronic design automation,fault simulation,logic testing,ISCAS benchmark,classic algorithms,electronic design automation,fault coverage,fault simulation,industrial circuits,pessimistic underestimation,pseudo-primary outputs,stuck-at fault classification,SAT,Unknown values,exact fault simulation,simulation pessimism
Stuck-at fault,Algorithm design,Fault coverage,Computer science,Real-time computing,Electronic design automation,Electronic circuit,Simulation algorithm,Benchmark (computing),Computation
Conference
ISSN
ISBN
Citations 
1530-1877
978-1-4673-0695-9
11
PageRank 
References 
Authors
0.55
12
4
Name
Order
Citations
PageRank
Stefan Hillebrecht1110.55
Michael A. Kochte227627.23
Hans-Joachim Wunderlich31822155.30
B. Becker419121.44